Abstract
We present a new method to measure 1/f noise in Josephson quantum bits (qubits) that yields low-frequency spectra below 1 Hz. A comparison of the noise taken at positive and negative bias of a phase qubit shows the dominant noise source to be flux noise and not junction critical-current noise, with a magnitude similar to that measured previously in other systems. Theoretical calculations show that the level of flux noise is not compatible with the standard model of noise from two-level state defects in the surface oxides of the films.
| Original language | English |
|---|---|
| Article number | 187006 |
| Journal | Physical Review Letters |
| Volume | 99 |
| Issue number | 18 |
| DOIs | |
| State | Published - 2 Nov 2007 |
| Externally published | Yes |