A measure of symmetry based on shape similarity

H. Zabrodsky; S. Peleg; D. Avnir

doi:10.1109/CVPR.1992.223196

A measure of symmetry based on shape similarity

H. Zabrodsky, S. Peleg, D. Avnir

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

28 Scopus citations

Abstract

The authors view symmetry as a continuous feature, and define a continuous symmetry measure (CSM) of shapes. The general definition of symmetry measure allows a comparison of the amount of symmetry of different shapes and the amount of different symmetries of a single shape. Furthermore, the CSM is associated with the symmetric shape that is closest to the given one, enabling visual evaluation of the CSM.

Original language	English
Title of host publication	Proceedings CVPR 1992 - IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Publisher	IEEE Computer Society
Pages	703-706
Number of pages	4
ISBN (Electronic)	0818628553
DOIs	https://doi.org/10.1109/CVPR.1992.223196
State	Published - 1992
Event	1992 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 1992 - Champaign, United States Duration: 15 Jun 1992 → 18 Jun 1992

Publication series

Name	Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Volume	1992-June
ISSN (Print)	1063-6919

Conference

Conference	1992 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 1992
Country/Territory	United States
City	Champaign
Period	15/06/92 → 18/06/92

Bibliographical note

Publisher Copyright:
© 1992 IEEE.

Access to Document

10.1109/CVPR.1992.223196

Cite this

Zabrodsky, H., Peleg, S., & Avnir, D. (1992). A measure of symmetry based on shape similarity. In Proceedings CVPR 1992 - IEEE Computer Society Conference on Computer Vision and Pattern Recognition (pp. 703-706). Article 223196 (Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition; Vol. 1992-June). IEEE Computer Society. https://doi.org/10.1109/CVPR.1992.223196

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author = "H. Zabrodsky and S. Peleg and D. Avnir",

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doi = "10.1109/CVPR.1992.223196",

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Zabrodsky, H, Peleg, S & Avnir, D 1992, A measure of symmetry based on shape similarity. in Proceedings CVPR 1992 - IEEE Computer Society Conference on Computer Vision and Pattern Recognition., 223196, Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition, vol. 1992-June, IEEE Computer Society, pp. 703-706, 1992 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 1992, Champaign, United States, 15/06/92. https://doi.org/10.1109/CVPR.1992.223196

A measure of symmetry based on shape similarity. / Zabrodsky, H.; Peleg, S.; Avnir, D.
Proceedings CVPR 1992 - IEEE Computer Society Conference on Computer Vision and Pattern Recognition. IEEE Computer Society, 1992. p. 703-706 223196 (Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition; Vol. 1992-June).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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A measure of symmetry based on shape similarity

Abstract

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