A millimeter-wave near-field scanning probe with an optical distance control

M. Golosovsky; A. Lann; D. Davidov

doi:10.1016/S0304-3991(97)00058-2

A millimeter-wave near-field scanning probe with an optical distance control

M. Golosovsky^*
, A. Lann
, D. Davidov

^*Corresponding author for this work

Racah Institute of Physics

Research output: Contribution to journal › Conference article › peer-review

12 Scopus citations

Abstract

We describe the design of a near-field millimeter (mm) wave resistivity microscope with a resonant-slit probe with a special emphasis (i) on the probe fabrication and (ii) on the probe-sample separation control. We describe an optical and capacitive control of the probe-sample separation. We study dependence of the millimeter-wave reflectivity of different materials on the probe-sample distance.

Original language	English
Pages (from-to)	133-141
Number of pages	9
Journal	Ultramicroscopy
Volume	71
Issue number	1-4
DOIs	https://doi.org/10.1016/S0304-3991(97)00058-2
State	Published - 1 Mar 1998
Event	Proceedings of the 1997 4th International Conference on Near-Field Optics and Related Techniques, NFO-4 - Jerusalem, Israel Duration: 9 Feb 1997 → 13 Feb 1997

Keywords

Microwave imaging
Near-field
Scanning probe

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10.1016/S0304-3991(97)00058-2

Cite this

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abstract = "We describe the design of a near-field millimeter (mm) wave resistivity microscope with a resonant-slit probe with a special emphasis (i) on the probe fabrication and (ii) on the probe-sample separation control. We describe an optical and capacitive control of the probe-sample separation. We study dependence of the millimeter-wave reflectivity of different materials on the probe-sample distance.",

keywords = "Microwave imaging, Near-field, Scanning probe",

author = "M. Golosovsky and A. Lann and D. Davidov",

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AU - Golosovsky, M.

AU - Lann, A.

AU - Davidov, D.

PY - 1998/3/1

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N2 - We describe the design of a near-field millimeter (mm) wave resistivity microscope with a resonant-slit probe with a special emphasis (i) on the probe fabrication and (ii) on the probe-sample separation control. We describe an optical and capacitive control of the probe-sample separation. We study dependence of the millimeter-wave reflectivity of different materials on the probe-sample distance.

AB - We describe the design of a near-field millimeter (mm) wave resistivity microscope with a resonant-slit probe with a special emphasis (i) on the probe fabrication and (ii) on the probe-sample separation control. We describe an optical and capacitive control of the probe-sample separation. We study dependence of the millimeter-wave reflectivity of different materials on the probe-sample distance.

KW - Microwave imaging

KW - Near-field

KW - Scanning probe

UR - https://www.scopus.com/pages/publications/0032033551

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JO - Ultramicroscopy

JF - Ultramicroscopy

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T2 - Proceedings of the 1997 4th International Conference on Near-Field Optics and Related Techniques, NFO-4

Y2 - 9 February 1997 through 13 February 1997

ER -

A millimeter-wave near-field scanning probe with an optical distance control

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Keywords

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