Abstract
A recently developed time-dependent quantum-mechanical Fourier method is employed for the simulation of scattering atoms from surfaces of solids. The method allows exact calculation of scattering intensities, resonance strengths and lifetimes, in systems with a very large number of populated diffraction peaks. The study applies the method to the He/stepped copper surface. The accuracy of the method is checked by comparing to close coupling results for the He/W system.
Original language | English |
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Pages (from-to) | 216-223 |
Number of pages | 8 |
Journal | Chemical Physics Letters |
Volume | 102 |
Issue number | 2-3 |
DOIs | |
State | Published - 18 Nov 1983 |