Abstract
A recently developed time-dependent quantum-mechanical Fourier method is employed for the simulation of scattering atoms from surfaces of solids. The method allows exact calculation of scattering intensities, resonance strengths and lifetimes, in systems with a very large number of populated diffraction peaks. The study applies the method to the He/stepped copper surface. The accuracy of the method is checked by comparing to close coupling results for the He/W system.
| Original language | English |
|---|---|
| Pages (from-to) | 216-223 |
| Number of pages | 8 |
| Journal | Chemical Physics Letters |
| Volume | 102 |
| Issue number | 2-3 |
| DOIs | |
| State | Published - 18 Nov 1983 |