Abstract
We present a simple and general purpose implementation for monitoring the lateral forces between a near-field optical probe and a surface. A feedback system based on this technique has been incorporated into a near-field optical fabrication system based on heatless material removal with an argon fluoride excimer laser. This has allowed the construction of an instrument that is capable of directly patterning a wide variety of materials with a resolution of less than 50 nm.
Original language | English |
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Pages (from-to) | 3538-3541 |
Number of pages | 4 |
Journal | Review of Scientific Instruments |
Volume | 64 |
Issue number | 12 |
DOIs | |
State | Published - 1993 |