Abstract
Measurements of the tunneling and phototunneling I-V and G-V characteristics have enabled the study of the distribution of states in the band-gap of hydrogenated amorpous silicon. It is found that regardless of the method of preparation and the material dopants there is a peak in the bulk and surface density of states which lies 0.45 eV below the conduction band edge. The density of states at the peak is concluded to be 1018 - 1019 cm-3 eV-1, decreasing by at least an order of magnitude for energies below and above this peak.
Original language | English |
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Pages (from-to) | 605-610 |
Number of pages | 6 |
Journal | Journal of Non-Crystalline Solids |
Volume | 35-36 |
Issue number | PART 1 |
DOIs | |
State | Published - 1980 |
Externally published | Yes |