Abstract
Measurements of the tunneling and phototunneling I-V and G-V characteristics have enabled the study of the distribution of states in the band-gap of hydrogenated amorpous silicon. It is found that regardless of the method of preparation and the material dopants there is a peak in the bulk and surface density of states which lies 0.45 eV below the conduction band edge. The density of states at the peak is concluded to be 1018 - 1019 cm-3 eV-1, decreasing by at least an order of magnitude for energies below and above this peak.
| Original language | English |
|---|---|
| Pages (from-to) | 605-610 |
| Number of pages | 6 |
| Journal | Journal of Non-Crystalline Solids |
| Volume | 35-36 |
| Issue number | PART 1 |
| DOIs | |
| State | Published - 1980 |
| Externally published | Yes |
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