TY - GEN
T1 - A theory of mutations with applications to vacuity, coverage, and fault tolerance
AU - Kupferman, Orna
AU - Li, Wenchao
AU - Seshia, Sanjit A.
PY - 2008
Y1 - 2008
N2 - The quality of formal specifications and the circuits they are written for can be evaluated through checks such as vacuity and coverage. Both checks involve mutations to the specification or the circuit implementation. In this context, we study and prove properties of mutations to finite-state systems. Since faults can be viewed as mutations, our theory of mutations can also be used in a formal approach to fault injection. We demonstrate theoretically and with experimental results how relations and orders amongst mutations can be used to improve specifications and reason about coverage of fault tolerant circuits.
AB - The quality of formal specifications and the circuits they are written for can be evaluated through checks such as vacuity and coverage. Both checks involve mutations to the specification or the circuit implementation. In this context, we study and prove properties of mutations to finite-state systems. Since faults can be viewed as mutations, our theory of mutations can also be used in a formal approach to fault injection. We demonstrate theoretically and with experimental results how relations and orders amongst mutations can be used to improve specifications and reason about coverage of fault tolerant circuits.
UR - http://www.scopus.com/inward/record.url?scp=58049158331&partnerID=8YFLogxK
U2 - 10.1109/FMCAD.2008.ECP.29
DO - 10.1109/FMCAD.2008.ECP.29
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AN - SCOPUS:58049158331
SN - 9781424427352
T3 - Proceedings of the 2008 International Conference on Formal Methods in Computer-Aided Design, FMCAD
BT - Proceedings of the 2008 International Conference on Formal Methods in Computer-Aided Design, FMCAD
T2 - 2008 International Conference on Formal Methods in Computer-Aided Design, FMCAD
Y2 - 17 November 2008 through 20 November 2008
ER -