A theory of mutations with applications to vacuity, coverage, and fault tolerance

Orna Kupferman*, Wenchao Li, Sanjit A. Seshia

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

39 Scopus citations

Abstract

The quality of formal specifications and the circuits they are written for can be evaluated through checks such as vacuity and coverage. Both checks involve mutations to the specification or the circuit implementation. In this context, we study and prove properties of mutations to finite-state systems. Since faults can be viewed as mutations, our theory of mutations can also be used in a formal approach to fault injection. We demonstrate theoretically and with experimental results how relations and orders amongst mutations can be used to improve specifications and reason about coverage of fault tolerant circuits.

Original languageEnglish
Title of host publicationProceedings of the 2008 International Conference on Formal Methods in Computer-Aided Design, FMCAD
DOIs
StatePublished - 2008
Event2008 International Conference on Formal Methods in Computer-Aided Design, FMCAD - Portland, OR, United States
Duration: 17 Nov 200820 Nov 2008

Publication series

NameProceedings of the 2008 International Conference on Formal Methods in Computer-Aided Design, FMCAD

Conference

Conference2008 International Conference on Formal Methods in Computer-Aided Design, FMCAD
Country/TerritoryUnited States
CityPortland, OR
Period17/11/0820/11/08

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