We describe a technique to measure absolute photo-induced cross sections for cluster anions stored in an electrostatic ion beam trap (EIBT) with a central deflector. The setup allows determination of total photo-destruction cross sections as well as partial cross sections for fragmentation and electron detachment. The unique properties of this special EIBT setup are investigated and illustrated using small Aln- clusters.
Bibliographical noteFunding Information:
This work has been supported by the Israeli Science Foundation (Grant No. 124/09), and by a research grant from the estate of David Turner. D.Sch. acknowledges support by the Weizmann Institute of Science through the Joseph Meyerhoff program.