Abstract
We describe a technique to measure absolute photo-induced cross sections for cluster anions stored in an electrostatic ion beam trap (EIBT) with a central deflector. The setup allows determination of total photo-destruction cross sections as well as partial cross sections for fragmentation and electron detachment. The unique properties of this special EIBT setup are investigated and illustrated using small Aln- clusters.
Original language | English |
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Article number | 053106 |
Journal | Review of Scientific Instruments |
Volume | 84 |
Issue number | 5 |
DOIs | |
State | Published - May 2013 |
Bibliographical note
Funding Information:This work has been supported by the Israeli Science Foundation (Grant No. 124/09), and by a research grant from the estate of David Turner. D.Sch. acknowledges support by the Weizmann Institute of Science through the Joseph Meyerhoff program.