An Analysis of BTI-Induced Degradation on Multi-Vth 28-nm Ring Oscillator

M Ella; F Ramadan; D Wattad; F Gabbay

An Analysis of BTI-Induced Degradation on Multi-Vth 28-nm Ring Oscillator

M Ella, F Ramadan, D Wattad, F Gabbay

The Institute of Applied Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Proceedings of the 6th International Conference on Microelectronic Devices and Technologies (MicDAT, 2024)
Subtitle of host publication	25-27 September 2024, Ibiza (Balearic Islands), Spain
Pages	63
Number of pages	1
State	Published - 2024

Publication series

Name	Microelectronic Devices and Technologies

Cite this

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title = "An Analysis of BTI-Induced Degradation on Multi-Vth 28-nm Ring Oscillator",

author = "M Ella and F Ramadan and D Wattad and F Gabbay",

year = "2024",

language = "אנגלית",

series = "Microelectronic Devices and Technologies",

pages = "63",

booktitle = "Proceedings of the 6th International Conference on Microelectronic Devices and Technologies (MicDAT, 2024)",

}

An Analysis of BTI-Induced Degradation on Multi-Vth 28-nm Ring Oscillator. / Ella, M; Ramadan, F; Wattad, D et al.
Proceedings of the 6th International Conference on Microelectronic Devices and Technologies (MicDAT, 2024): 25-27 September 2024, Ibiza (Balearic Islands), Spain. 2024. p. 63 (Microelectronic Devices and Technologies).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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