An extreme ultraviolet spectroscopic diagnostic for fluctuations of electron density and temperature in tokamak plasmas

L. K. Huang*, M. Finkenthal, A. K. Bhatia, H. W. Moos

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Extreme ultraviolet (XUV) spectral line emissivities, originating from resonant transitions with upper states excited mainly from ground or both ground and lowest metastable states by electron collisional excitations of highly ionized intrinsic impurities in tokamak plasmas, are linear functions of both electron density and temperature fluctuations, ñe and T̃e, when the fluctuations are small and at high frequency. Correlations between measured intensities of spectral lines can thus provide localized measurements of the fluctuations. Newly developed XUV monochromators of high throughput enable accurate and fast diagnostics of ñe and T̃e for the study of the tokamak plasma microturbulence.

Original languageEnglish
Pages (from-to)5511-5518
Number of pages8
JournalJournal of Applied Physics
Volume68
Issue number11
DOIs
StatePublished - 1990
Externally publishedYes

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