Abstract
X-ray photoelectron spectrocopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) have been used to characterize the surface chemistry of copolymers of poly(sebacic anhydride) with ricinoleic acid maleate, ToF-SIMS analysis yielded fragmentation patterns consisting of ions diagnostic of both monomers. Across the copolymer series, relative peak intensities of these diagnostic ions showed a good comparison between surface and bulk composition, in accordance with the XPS analysis. ToF-SIMS data also indicated that these copolymers consisted of either random or block sections.
Original language | English |
---|---|
Pages (from-to) | 8957-8965 |
Number of pages | 9 |
Journal | Macromolecules |
Volume | 31 |
Issue number | 25 |
DOIs | |
State | Published - 15 Dec 1998 |