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Bias and Its Control in Stochastic Approaches to Electronic-Structure Theory

  • Pavel Savchenko
  • , Sayak Adhikari
  • , Efrat Hadad
  • , Eran Rabani*
  • , Roi Baer*
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Stochastic formulations of electronic-structure theory often reduce computational cost by replacing exact contractions with statistical estimates obtained from random samples, a procedure that inherently introduces random fluctuations and systematic bias. The fluctuations decay as M–1/2 with the number of samples M, whereas the bias generated in nonlinear or self-consistent settings decays as M–1 and can remain significant for moderate M. To control this bias we employ the jackknife-2 estimator, which reduces its leading term to (Formula presented) with only modest extra cost. We examine bias formation and removal in three settings: (i) stochastic treatments of the Markovian master equation using bundled dissipators, (ii) stochastic Kohn–Sham density functional theory for warm dense hydrogen, and (iii) stochastic evaluation of the Hubbard-model partition function. The first two settings have been presented in earlier works; accordingly, we review them only briefly and focus primarily on the issue of bias control. The Hubbard-model application is entirely new. For this case, we present two approaches: a direct estimator, which has large variance but no bias, and a “midway transition probability” (ΣMTP) estimator, which has smaller variance but introduces bias. Applying the jackknife-2 procedure to the ΣMTP estimator controls this bias and yields a substantially lower total error than the direct estimator. Across all cases, jackknife bias removal markedly improves the accuracy and reliability of stochastic electronic-structure calculations without increasing the computational cost.

Original languageEnglish
Pages (from-to)3316-3326
Number of pages11
JournalJournal of Chemical Theory and Computation
Volume22
Issue number7
DOIs
StatePublished - 14 Apr 2026

Bibliographical note

Publisher Copyright:
© 2026 The Authors. Published by American Chemical Society

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