Bistability in silicon microring resonator based on strain induced by a piezoelectric lead zirconate titanate thin film

Y. Sebbag, I. Goykhman, B. Desiatov, T. Nachmias, O. Yoshaei, M. Kabla, S. E. Meltzer, U. Levy*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

16 Scopus citations

Abstract

We demonstrate bistability in a submicron silicon optical phase shifter based on the photoelastic effect. The strain magnitude is electrically controlled by a piezoelectric thin film placed on top of the device. The hysteresis behavior of the piezoelectric response shows potential application as bistable device independent of the optical intensity.

Original languageAmerican English
Article number141107
JournalApplied Physics Letters
Volume100
Issue number14
DOIs
StatePublished - 2 Apr 2012

Bibliographical note

Funding Information:
The authors acknowledge technical support from Noa Mazursky. The research was supported in parts by the Israeli Science Foundation. Ilya Goykhman and Boris Desiatov acknowledge the Eshkol fellowship from the Israeli Ministry of Science and Technology. The devices were fabricated at the Center for Nanoscience and Nanotechnology, The Hebrew University of Jerusalem.

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