Fingerprint
Dive into the research topics of 'Characterization of short-range leakage currents in undoped polycrystalline Si by means of capacitance-voltage measurement'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Characterization of short-range leakage currents in undoped polycrystalline Si by means of capacitance-voltage measurement
Y. Alpern*, J. Shappir
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review