Abstract
An extension of the noise measurements of Fleming and Grimes is reported for frequencies up to 100 MHz and at various temperatures. Somewhat below the lower transition temperature T2, the frequency of the noise varies quadratically with the applied dc voltage. At lower temperatures a very different behavior is observed. We attribute the narrowband noise to coupled relaxation oscillators and suggest that the voltage-frequency relation reflects the distribution of CDW segments.
Original language | English |
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Pages (from-to) | 243-247 |
Number of pages | 5 |
Journal | Solid State Communications |
Volume | 35 |
Issue number | 3 |
DOIs | |
State | Published - Jul 1980 |