Compact diode-based multi-energy soft x-ray diagnostic for NSTX

K. Tritz; D. J. Clayton; D. Stutman; M. Finkenthal

doi:10.1063/1.4731741

Compact diode-based multi-energy soft x-ray diagnostic for NSTX

K. Tritz, D. J. Clayton, D. Stutman, M. Finkenthal^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

15 Scopus citations

Abstract

A novel and compact, diode-based, multi-energy soft x-ray (ME-SXR) diagnostic has been developed for the National Spherical Tokamak Experiment. The new edge ME-SXR system tested on NSTX consists of a set of vertically stacked diode arrays, each viewing the plasma tangentially through independent pinholes and filters providing an overlapping view of the plasma midplane which allows simultaneous SXR measurements with coarse sub-sampling of the x-ray spectrum. Using computed x-ray spectral emission data, combinations of filters can provide fast (>10 kHz) measurements of changes in the electron temperature and density profiles providing a method to fill-in the gaps of the multi-point Thomson scattering system.

Original language	English
Article number	10E109
Journal	Review of Scientific Instruments
Volume	83
Issue number	10
DOIs	https://doi.org/10.1063/1.4731741
State	Published - Oct 2012
Externally published	Yes

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10.1063/1.4731741

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abstract = "A novel and compact, diode-based, multi-energy soft x-ray (ME-SXR) diagnostic has been developed for the National Spherical Tokamak Experiment. The new edge ME-SXR system tested on NSTX consists of a set of vertically stacked diode arrays, each viewing the plasma tangentially through independent pinholes and filters providing an overlapping view of the plasma midplane which allows simultaneous SXR measurements with coarse sub-sampling of the x-ray spectrum. Using computed x-ray spectral emission data, combinations of filters can provide fast (>10 kHz) measurements of changes in the electron temperature and density profiles providing a method to fill-in the gaps of the multi-point Thomson scattering system.",

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AB - A novel and compact, diode-based, multi-energy soft x-ray (ME-SXR) diagnostic has been developed for the National Spherical Tokamak Experiment. The new edge ME-SXR system tested on NSTX consists of a set of vertically stacked diode arrays, each viewing the plasma tangentially through independent pinholes and filters providing an overlapping view of the plasma midplane which allows simultaneous SXR measurements with coarse sub-sampling of the x-ray spectrum. Using computed x-ray spectral emission data, combinations of filters can provide fast (>10 kHz) measurements of changes in the electron temperature and density profiles providing a method to fill-in the gaps of the multi-point Thomson scattering system.

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Compact diode-based multi-energy soft x-ray diagnostic for NSTX

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