Control and characterization of spatio-temporal disorder in parametrically excited surface waves

T. Epstein*, J. Fineberg

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

The nonlinear interactions of parametrically excited surface waves have been shown to yield a rich family of nonlinear states. When the system Is driven by two commensurate frequencies, a variety of interesting auperlattice type states are generated via a number of different 3-wave resonant interactions, These states occur either as symmetry-breaking bifurcations of hexagonal patterns composed of a single unstable mode or via nonlinear interactions between the two different unstable modes generated by the two forcing frequencies. Near the system's bicritical point, a well-defined region of phase space exists in which a highly disordered state, both in space and time, is observed. We first show that this state results from the competition between two distinct nonlinear super-lattice states, each with different characteristic temporal and spatial symmetries. After characterizing the type of spatio-temporal disorder that is embodied in this disordered state, we will demonstrate that it can be controlled, Control to either of its neighboring nonlinear states is achieved by the application of a small-amplitude excitation at a third frequency, where the spatial symmetry of the selected pattern is determined by the temporal symmetry of the third frequency used. This technique can also excite rapid switching between different nonlinear states.

Original languageEnglish
Pages (from-to)903-913
Number of pages11
JournalPramana - Journal of Physics
Volume64
Issue number6 SPEC. ISS.
DOIs
StatePublished - Jun 2005

Keywords

  • Control
  • Nonlinear waves
  • Patterns
  • Spatio-temporal chaos

Fingerprint

Dive into the research topics of 'Control and characterization of spatio-temporal disorder in parametrically excited surface waves'. Together they form a unique fingerprint.

Cite this