TY - JOUR
T1 - Creation of Boron Vacancies in Hexagonal Boron Nitride Exfoliated from Bulk Crystals for Quantum Sensing
AU - Zabelotsky, Ty
AU - Singh, Sourabh
AU - Haim, Galya
AU - Malkinson, Rotem
AU - Kadkhodazadeh, Shima
AU - Radko, Ilya P.
AU - Aharonovich, Igor
AU - Steinberg, Hadar
AU - Berg-Sørensen, Kirstine
AU - Huck, Alexander
AU - Taniguchi, Takashi
AU - Watanabe, Kenji
AU - Bar-Gill, Nir
N1 - Publisher Copyright:
© 2023 American Chemical Society.
PY - 2023/12/8
Y1 - 2023/12/8
N2 - Boron vacancies (VB-) in hexagonal boron -nitride (hBN) have sparked great interest in recent years due to their optical and spin properties. Since hBN can be readily integrated into devices where it interfaces a huge variety of other 2D materials, boron vacancies may serve as a precise sensor which can be deployed at very close proximity to many important materials systems. Boron vacancy defects may be produced by a number of existing methods, the use of which may depend on the final application. Any method should reproducibly generate defects with controlled density and desired pattern. To date, however, detailed studies of such methods are missing. In this paper, we study various techniques for the preparation of hBN flakes from bulk crystals and relevant postprocessing treatments, namely, focused ion beam (FIB) implantation, for creation of VB-s as a function of flake thickness and defect concentrations. We find that flake thickness plays an important role when optimizing implantation parameters, while careful sample cleaning proved important to achieve consistent results.
AB - Boron vacancies (VB-) in hexagonal boron -nitride (hBN) have sparked great interest in recent years due to their optical and spin properties. Since hBN can be readily integrated into devices where it interfaces a huge variety of other 2D materials, boron vacancies may serve as a precise sensor which can be deployed at very close proximity to many important materials systems. Boron vacancy defects may be produced by a number of existing methods, the use of which may depend on the final application. Any method should reproducibly generate defects with controlled density and desired pattern. To date, however, detailed studies of such methods are missing. In this paper, we study various techniques for the preparation of hBN flakes from bulk crystals and relevant postprocessing treatments, namely, focused ion beam (FIB) implantation, for creation of VB-s as a function of flake thickness and defect concentrations. We find that flake thickness plays an important role when optimizing implantation parameters, while careful sample cleaning proved important to achieve consistent results.
KW - boron vacancy defects
KW - electron irradiation
KW - hBN
KW - ion implantation
KW - optical spectroscopy
KW - spin resonance
UR - http://www.scopus.com/inward/record.url?scp=85179819355&partnerID=8YFLogxK
U2 - 10.1021/acsanm.3c03395
DO - 10.1021/acsanm.3c03395
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C2 - 38835900
AN - SCOPUS:85179819355
SN - 2574-0970
VL - 6
SP - 21671
EP - 21678
JO - ACS Applied Nano Materials
JF - ACS Applied Nano Materials
IS - 23
ER -