Critical resistivity of antiferromagnetic semiconductors

I. Balberg*, S. Alexander, J. S. Helman

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

The resistivity of nearly stoichiometric iron oxide was measured in the temperature range 78<~T<~300°K. The temperature derivative of the resistivity, dρdT, in the vicinity of the critical temperature, Tc, was found to be proportional to ε-0.4, where ε=|(T-Tc)Tc|. The results are explained by incorporating a normalized Ornstein-Zernike correlation function into the de Gennes-Friedel formula for critical scattering.

Original languageEnglish
Pages (from-to)836-839
Number of pages4
JournalPhysical Review Letters
Volume33
Issue number14
DOIs
StatePublished - 1974

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