Abstract
This paper reports recent progress in the use of HgI2 in high energy resolution X-ray and gamma ray spectrometers which operate at room temperature, and reviews the present state of the art of HgI2 technology. Purification of starting materials, methods of crystal growth, detector fabrication, and characterization methods used for HgI2 are described, and some applications of HgI2 detectors to various device systems are given.
| Original language | English |
|---|---|
| Pages (from-to) | 353-364 |
| Number of pages | 12 |
| Journal | Journal of Crystal Growth |
| Volume | 65 |
| Issue number | 1-3 |
| DOIs | |
| State | Published - 2 Dec 1983 |
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