Current-induced surface dislocations on thin gold films

N. Shimoni; O. Biham; O. Millo

doi:10.1016/S0039-6028(98)00417-8

Current-induced surface dislocations on thin gold films

N. Shimoni, O. Biham, O. Millo^*

^*Corresponding author for this work

Racah Institute of Physics

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

The appearance and evolution of surface dislocations on the surface of flame-annealed gold films due to current stressing (electromigration) are studied using scanning tunneling microscopy. Many line dislocations are present on the surface of such films, probably formed during the annealing process. Yet, at room temperature, with no current stressing, the formation of new surface dislocations is rare. When a current is applied through the film, new line dislocations often emerge. The new dislocations run predominantly in directions close to that of the current, and usually appear in correlation with the onset of the current.

Original language	American English
Pages (from-to)	L925-L931
Journal	Surface Science
Volume	414
Issue number	1-2
DOIs	https://doi.org/10.1016/S0039-6028(98)00417-8
State	Published - 11 Sep 1998

Bibliographical note

Funding Information:
This work was supported by Intel-Israel College Relations Committee in coordination with E. Bar-Sadeh and Y. Yagil. We also thank D. Mandler and L. De-Zhong for providing the flame-annealed gold films, and Y. Goldstein for interesting discussions.

Keywords

Dislocations
Electromigration
Scanning tunneling microscopy
Surface dynamics

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10.1016/S0039-6028(98)00417-8

Cite this

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title = "Current-induced surface dislocations on thin gold films",

abstract = "The appearance and evolution of surface dislocations on the surface of flame-annealed gold films due to current stressing (electromigration) are studied using scanning tunneling microscopy. Many line dislocations are present on the surface of such films, probably formed during the annealing process. Yet, at room temperature, with no current stressing, the formation of new surface dislocations is rare. When a current is applied through the film, new line dislocations often emerge. The new dislocations run predominantly in directions close to that of the current, and usually appear in correlation with the onset of the current.",

keywords = "Dislocations, Electromigration, Scanning tunneling microscopy, Surface dynamics",

author = "N. Shimoni and O. Biham and O. Millo",

note = "Funding Information: This work was supported by Intel-Israel College Relations Committee in coordination with E. Bar-Sadeh and Y. Yagil. We also thank D. Mandler and L. De-Zhong for providing the flame-annealed gold films, and Y. Goldstein for interesting discussions. ",

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AU - Biham, O.

AU - Millo, O.

N1 - Funding Information: This work was supported by Intel-Israel College Relations Committee in coordination with E. Bar-Sadeh and Y. Yagil. We also thank D. Mandler and L. De-Zhong for providing the flame-annealed gold films, and Y. Goldstein for interesting discussions.

PY - 1998/9/11

Y1 - 1998/9/11

N2 - The appearance and evolution of surface dislocations on the surface of flame-annealed gold films due to current stressing (electromigration) are studied using scanning tunneling microscopy. Many line dislocations are present on the surface of such films, probably formed during the annealing process. Yet, at room temperature, with no current stressing, the formation of new surface dislocations is rare. When a current is applied through the film, new line dislocations often emerge. The new dislocations run predominantly in directions close to that of the current, and usually appear in correlation with the onset of the current.

AB - The appearance and evolution of surface dislocations on the surface of flame-annealed gold films due to current stressing (electromigration) are studied using scanning tunneling microscopy. Many line dislocations are present on the surface of such films, probably formed during the annealing process. Yet, at room temperature, with no current stressing, the formation of new surface dislocations is rare. When a current is applied through the film, new line dislocations often emerge. The new dislocations run predominantly in directions close to that of the current, and usually appear in correlation with the onset of the current.

KW - Dislocations

KW - Electromigration

KW - Scanning tunneling microscopy

KW - Surface dynamics

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DO - 10.1016/S0039-6028(98)00417-8

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SP - L925-L931

JO - Surface Science

JF - Surface Science

IS - 1-2

ER -

Current-induced surface dislocations on thin gold films

Abstract

Bibliographical note

Keywords

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