Abstract
We demonstrate a deep learning-based 3D virtual refocusing framework for fluorescence microscopy, which extends the imaging depth-of-field by 20-fold and corrects various aberrations, all digitally performed after a 2D image of the sample is captured.
Original language | English |
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Title of host publication | 2020 Conference on Lasers and Electro-Optics, CLEO 2020 - Proceedings |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9781943580767 |
State | Published - May 2020 |
Externally published | Yes |
Event | 2020 Conference on Lasers and Electro-Optics, CLEO 2020 - San Jose, United States Duration: 10 May 2020 → 15 May 2020 |
Publication series
Name | Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS |
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Volume | 2020-May |
ISSN (Print) | 1092-8081 |
Conference
Conference | 2020 Conference on Lasers and Electro-Optics, CLEO 2020 |
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Country/Territory | United States |
City | San Jose |
Period | 10/05/20 → 15/05/20 |
Bibliographical note
Publisher Copyright:© 2020 OSA.