Abstract
We demonstrate a deep learning-based 3D virtual refocusing framework for fluorescence microscopy, which extends the imaging depth-of-field by 20-fold and corrects various aberrations, all digitally performed after a 2D image of the sample is captured.
| Original language | English |
|---|---|
| Title of host publication | 2020 Conference on Lasers and Electro-Optics, CLEO 2020 - Proceedings |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (Electronic) | 9781943580767 |
| State | Published - May 2020 |
| Externally published | Yes |
| Event | 2020 Conference on Lasers and Electro-Optics, CLEO 2020 - San Jose, United States Duration: 10 May 2020 → 15 May 2020 |
Publication series
| Name | Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS |
|---|---|
| Volume | 2020-May |
| ISSN (Print) | 1092-8081 |
Conference
| Conference | 2020 Conference on Lasers and Electro-Optics, CLEO 2020 |
|---|---|
| Country/Territory | United States |
| City | San Jose |
| Period | 10/05/20 → 15/05/20 |
Bibliographical note
Publisher Copyright:© 2020 OSA.
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