Defect review in the photonics revolution: The critical role of near-field optics in the characterization of waveguides, optical interconnects, optical and electro-optical switches, lasers and their integrated emulations

A. Lewis

doi:10.1117/12.424817

Defect review in the photonics revolution: The critical role of near-field optics in the characterization of waveguides, optical interconnects, optical and electro-optical switches, lasers and their integrated emulations

A. Lewis

The Institute of Applied Physics

Research output: Contribution to journal › Conference article › peer-review

Abstract

The critical role of near-field optics in the characterization of waveguides, optical interconnects, electro-optical switches, lasers and their integrated emulations were discussed. With the advancement of new technologies, optical devices depends on characterizing, high resolution, the distribution of light in the near-field at the output of the devices. It is also necessary to relate microdistributions and nanodistribution of light to exact topography and exact spatial distribution of electrical and thermal properties of the devices.

Original language	English
Pages (from-to)	59-64
Number of pages	6
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	4289
DOIs	https://doi.org/10.1117/12.424817
State	Published - 2001
Event	WDM and Photonic Switching Devices for Network Applications II - San Jose, CA, United States Duration: 25 Jan 2001 → 26 Jan 2001

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journal = "Proceedings of SPIE - The International Society for Optical Engineering",

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note = "WDM and Photonic Switching Devices for Network Applications II ; Conference date: 25-01-2001 Through 26-01-2001",

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Defect review in the photonics revolution: The critical role of near-field optics in the characterization of waveguides, optical interconnects, optical and electro-optical switches, lasers and their integrated emulations. / Lewis, A.
In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 4289, 2001, p. 59-64.

Research output: Contribution to journal › Conference article › peer-review

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Defect review in the photonics revolution: The critical role of near-field optics in the characterization of waveguides, optical interconnects, optical and electro-optical switches, lasers and their integrated emulations

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