Demonstration of a bit-flip correction for enhanced sensitivity measurements

L. Cohen*, Y. Pilnyak, D. Istrati, A. Retzker, H. S. Eisenberg

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


Error correction can be used to recover the sensitivity in a noisy environment. We implement such correction after a bit-flip error. Our results show 87% recovery of the sensitivity, independent of the noise rate.

Original languageAmerican English
Title of host publicationFrontiers in Optics, FiO 2016
PublisherOptica Publishing Group (formerly OSA)
ISBN (Print)9781943580194
StatePublished - 2016
EventFrontiers in Optics, FiO 2016 - Rochester, United States
Duration: 17 Oct 201621 Oct 2016

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701


ConferenceFrontiers in Optics, FiO 2016
Country/TerritoryUnited States

Bibliographical note

Publisher Copyright:
© OSA 2016.


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