Demonstration of a bit-flip correction for enhanced sensitivity measurements

L. Cohen*, Y. Pilnyak, D. Istrati, A. Retzker, H. S. Eisenberg

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Error correction can be used to recover the sensitivity in a noisy environment. We implement such correction after a bit-flip error. Our results show 87% recovery of the sensitivity, independent of the noise rate.

Original languageAmerican English
Title of host publicationQuantum Information and Measurement, QIM 2017
PublisherOptica Publishing Group (formerly OSA)
ISBN (Print)9781943580262
DOIs
StatePublished - 2017
EventQuantum Information and Measurement, QIM 2017 - Paris, France
Duration: 5 Apr 20177 Apr 2017

Publication series

NameOptics InfoBase Conference Papers
VolumePart F73-QIM 2017
ISSN (Electronic)2162-2701

Conference

ConferenceQuantum Information and Measurement, QIM 2017
Country/TerritoryFrance
CityParis
Period5/04/177/04/17

Bibliographical note

Publisher Copyright:
© OSA 2017.

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