Demonstration of a bit-flip correction for enhanced sensitivity measurements

L. Cohen; Y. Pilnyak; D. Istrati; A. Retzker; H. S. Eisenberg

doi:10.1364/QIM.2017.QW3A.3

Demonstration of a bit-flip correction for enhanced sensitivity measurements

L. Cohen^*
, Y. Pilnyak
, D. Istrati
, A. Retzker
, H. S. Eisenberg

^*Corresponding author for this work

Racah Institute of Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Error correction can be used to recover the sensitivity in a noisy environment. We implement such correction after a bit-flip error. Our results show 87% recovery of the sensitivity, independent of the noise rate.

Original language	English
Title of host publication	Quantum Information and Measurement, QIM 2017
Publisher	Optica Publishing Group (formerly OSA)
ISBN (Print)	9781943580262
DOIs	https://doi.org/10.1364/QIM.2017.QW3A.3
State	Published - 2017
Event	Quantum Information and Measurement, QIM 2017 - Paris, France Duration: 5 Apr 2017 → 7 Apr 2017

Publication series

Name	Optics InfoBase Conference Papers
Volume	Part F73-QIM 2017
ISSN (Electronic)	2162-2701

Conference

Conference	Quantum Information and Measurement, QIM 2017
Country/Territory	France
City	Paris
Period	5/04/17 → 7/04/17

Bibliographical note

Publisher Copyright:
© OSA 2017.

Access to Document

10.1364/QIM.2017.QW3A.3

Cite this

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title = "Demonstration of a bit-flip correction for enhanced sensitivity measurements",

abstract = "Error correction can be used to recover the sensitivity in a noisy environment. We implement such correction after a bit-flip error. Our results show 87\% recovery of the sensitivity, independent of the noise rate.",

author = "L. Cohen and Y. Pilnyak and D. Istrati and A. Retzker and Eisenberg, \{H. S.\}",

note = "Publisher Copyright: {\textcopyright} OSA 2017.; Quantum Information and Measurement, QIM 2017 ; Conference date: 05-04-2017 Through 07-04-2017",

year = "2017",

doi = "10.1364/QIM.2017.QW3A.3",

language = "אנגלית",

isbn = "9781943580262",

series = "Optics InfoBase Conference Papers",

publisher = "Optica Publishing Group (formerly OSA)",

booktitle = "Quantum Information and Measurement, QIM 2017",

}

Cohen, L, Pilnyak, Y, Istrati, D , Retzker, A & Eisenberg, HS 2017, Demonstration of a bit-flip correction for enhanced sensitivity measurements. in Quantum Information and Measurement, QIM 2017. Optics InfoBase Conference Papers, vol. Part F73-QIM 2017, Optica Publishing Group (formerly OSA), Quantum Information and Measurement, QIM 2017, Paris, France, 5/04/17. https://doi.org/10.1364/QIM.2017.QW3A.3

Demonstration of a bit-flip correction for enhanced sensitivity measurements. / Cohen, L.; Pilnyak, Y.; Istrati, D. et al.
Quantum Information and Measurement, QIM 2017. Optica Publishing Group (formerly OSA), 2017. (Optics InfoBase Conference Papers; Vol. Part F73-QIM 2017).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Demonstration of a bit-flip correction for enhanced sensitivity measurements

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AU - Istrati, D.

AU - Retzker, A.

AU - Eisenberg, H. S.

PY - 2017

Y1 - 2017

N2 - Error correction can be used to recover the sensitivity in a noisy environment. We implement such correction after a bit-flip error. Our results show 87% recovery of the sensitivity, independent of the noise rate.

AB - Error correction can be used to recover the sensitivity in a noisy environment. We implement such correction after a bit-flip error. Our results show 87% recovery of the sensitivity, independent of the noise rate.

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AN - SCOPUS:85036470740

SN - 9781943580262

T3 - Optics InfoBase Conference Papers

BT - Quantum Information and Measurement, QIM 2017

PB - Optica Publishing Group (formerly OSA)

T2 - Quantum Information and Measurement, QIM 2017

Y2 - 5 April 2017 through 7 April 2017

ER -

Demonstration of a bit-flip correction for enhanced sensitivity measurements

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Bibliographical note

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