Demonstration of a bit-flip correction for enhanced sensitivity measurements

L. Cohen*, Y. Pilnyak, D. Istrati, A. Retzker, H. S. Eisenberg

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Error correction can be used to recover the sensitivity in a noisy environment. We implement such correction after a bit-flip error. Our results show 87% recovery of the sensitivity, independent of the noise rate.

Original languageAmerican English
Title of host publicationFrontiers in Optics, FiO 2016
PublisherOSA - The Optical Society
ISBN (Print)9781943580194
DOIs
StatePublished - 21 Jul 2014
EventFrontiers in Optics, FiO 2016 - Rochester, United States
Duration: 17 Oct 201621 Oct 2016

Publication series

NameOptics InfoBase Conference Papers

Conference

ConferenceFrontiers in Optics, FiO 2016
Country/TerritoryUnited States
CityRochester
Period17/10/1621/10/16

Bibliographical note

Publisher Copyright:
© OSA 2016.

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