Dependence of the photorefractive properties of KTa1-xNb xO3:Cu,V on Cu valence state concentration

Victor Leyva; Aharon Agranat; Amnon Yariv

doi:10.1063/1.344546

Dependence of the photorefractive properties of KTa_1-xNb _xO₃:Cu,V on Cu valence state concentration

Victor Leyva^*, Aharon Agranat, Amnon Yariv

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

Absorption measurements and electron microprobe analysis are used to determine the density of Cu¹⁺ and Cu²⁺ ions in a photorefractive KTa_1-x Nb_x O₃: Cu,V sample. Photorefractive measurements are made over a wide range of Cu¹⁺ and Cu²⁺ concentrations, altered by a series of oxidation and reduction treatments. Diffraction efficiencies were varied by over an order of magnitude while erasure rates were varied by over two orders of magnitude.

Original language	English
Pages (from-to)	7162-7165
Number of pages	4
Journal	Journal of Applied Physics
Volume	67
Issue number	11
DOIs	https://doi.org/10.1063/1.344546
State	Published - 1990
Externally published	Yes

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10.1063/1.344546

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title = "Dependence of the photorefractive properties of KTa1-xNb xO3:Cu,V on Cu valence state concentration",

abstract = "Absorption measurements and electron microprobe analysis are used to determine the density of Cu1+ and Cu2+ ions in a photorefractive KTa1-x Nbx O3: Cu,V sample. Photorefractive measurements are made over a wide range of Cu1+ and Cu2+ concentrations, altered by a series of oxidation and reduction treatments. Diffraction efficiencies were varied by over an order of magnitude while erasure rates were varied by over two orders of magnitude.",

author = "Victor Leyva and Aharon Agranat and Amnon Yariv",

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doi = "10.1063/1.344546",

language = "אנגלית",

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pages = "7162--7165",

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T1 - Dependence of the photorefractive properties of KTa1-xNb xO3:Cu,V on Cu valence state concentration

AU - Leyva, Victor

AU - Agranat, Aharon

AU - Yariv, Amnon

PY - 1990

Y1 - 1990

N2 - Absorption measurements and electron microprobe analysis are used to determine the density of Cu1+ and Cu2+ ions in a photorefractive KTa1-x Nbx O3: Cu,V sample. Photorefractive measurements are made over a wide range of Cu1+ and Cu2+ concentrations, altered by a series of oxidation and reduction treatments. Diffraction efficiencies were varied by over an order of magnitude while erasure rates were varied by over two orders of magnitude.

AB - Absorption measurements and electron microprobe analysis are used to determine the density of Cu1+ and Cu2+ ions in a photorefractive KTa1-x Nbx O3: Cu,V sample. Photorefractive measurements are made over a wide range of Cu1+ and Cu2+ concentrations, altered by a series of oxidation and reduction treatments. Diffraction efficiencies were varied by over an order of magnitude while erasure rates were varied by over two orders of magnitude.

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DO - 10.1063/1.344546

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AN - SCOPUS:0008405394

SN - 0021-8979

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JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 11

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Dependence of the photorefractive properties of KTa_1-xNb _xO₃:Cu,V on Cu valence state concentration

Abstract

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