Detection and electrical characterization of hidden layers using time-domain analysis of terahertz reflections

We use a time-domain analysis method to characterize the outer layer of a multilayer structure regardless of the inner ones, thus simplifying the characterization of all the layers. We combine this method with THz reflection spectroscopy to detect nondestructively a hidden aluminum oxide layer under opaque paint and to measure its conductivity and high-frequency dielectric constant in the THz range.