Determination of quantum yields in two-dimensional scattering systems

Yikui Du, Joseph Rabani*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

A simple method for the determination of photochemical quantum yields (Φ) in light scattering system is proposed. The method is applied for two-dimensional (2D) reactors, such as photocatalytic layers, where scattered light can exit only through the front or rear surfaces. The determination of Φ is based on the measurement of both product formation rate, R, and the transmitted light (IT) in the 2D system, comparing two 2D reactors (layers with thickness L 1 and L 2, or suspensions with concentration C 1 and C 2), respectively. A good approximation of the quantum yield can be derived from the equation: Φ=(R2-R1)/(IT(1)-IT(2)), where the numbers in parenthesis refer to the given reactor. Satisfactory accuracy is obtained with "D1"=0.6-1 and "D2"=1.2-2, where " D 1" and " D 2" represent the respective apparent spectrophotometric absorbance of the 2D reactors. The method requires only a light intensity detector or a chemical actinometer. Systematic errors are discussed.

Original languageEnglish
Pages (from-to)575-578
Number of pages4
JournalJournal of Photochemistry and Photobiology A: Chemistry
Volume162
Issue number2-3
DOIs
StatePublished - 15 Mar 2004

Keywords

  • Layers
  • Light scattering
  • Photolysis
  • Quantum yield
  • Titanium dioxide

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