Determination of the recombination processes in copper ternary chalcopyrites by phototransport measurements

Y. Lubianiker; G. Bitton; I. Balberg; O. Resto; S. Z. Weisz

Determination of the recombination processes in copper ternary chalcopyrites by phototransport measurements

Y. Lubianiker^*
, G. Bitton
, I. Balberg
, O. Resto
, S. Z. Weisz

^*Corresponding author for this work

Racah Institute of Physics

Research output: Contribution to journal › Conference article › peer-review

Abstract

We have measured the phototransport properties of CuGaSe₂ films as a function of temperature. The simplest model which is consistent with all the experimental results consists of two recombination levels, one of which is donor-like and the other is acceptor-like. This model is similar to the symmetrical two-level model, which we have recently suggested for CuInS₂ films. We thus conclude that this model, with slight variations, represents the general recombination level structure in all copper ternary chalcopyrites.

Original language	English
Pages (from-to)	207-212
Number of pages	6
Journal	Materials Research Society Symposium - Proceedings
Volume	426
State	Published - 1996
Event	Proceedings of the 1996 MRS Spring Symposium - San Francisco, CA, USA Duration: 8 Apr 1996 → 11 Apr 1996

Cite this

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title = "Determination of the recombination processes in copper ternary chalcopyrites by phototransport measurements",

abstract = "We have measured the phototransport properties of CuGaSe2 films as a function of temperature. The simplest model which is consistent with all the experimental results consists of two recombination levels, one of which is donor-like and the other is acceptor-like. This model is similar to the symmetrical two-level model, which we have recently suggested for CuInS2 films. We thus conclude that this model, with slight variations, represents the general recombination level structure in all copper ternary chalcopyrites.",

author = "Y. Lubianiker and G. Bitton and I. Balberg and O. Resto and Weisz, \{S. Z.\}",

year = "1996",

language = "אנגלית",

volume = "426",

pages = "207--212",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

publisher = "Springer International Publishing AG",

note = "Proceedings of the 1996 MRS Spring Symposium ; Conference date: 08-04-1996 Through 11-04-1996",

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TY - JOUR

T1 - Determination of the recombination processes in copper ternary chalcopyrites by phototransport measurements

AU - Lubianiker, Y.

AU - Bitton, G.

AU - Balberg, I.

AU - Resto, O.

AU - Weisz, S. Z.

PY - 1996

Y1 - 1996

N2 - We have measured the phototransport properties of CuGaSe2 films as a function of temperature. The simplest model which is consistent with all the experimental results consists of two recombination levels, one of which is donor-like and the other is acceptor-like. This model is similar to the symmetrical two-level model, which we have recently suggested for CuInS2 films. We thus conclude that this model, with slight variations, represents the general recombination level structure in all copper ternary chalcopyrites.

AB - We have measured the phototransport properties of CuGaSe2 films as a function of temperature. The simplest model which is consistent with all the experimental results consists of two recombination levels, one of which is donor-like and the other is acceptor-like. This model is similar to the symmetrical two-level model, which we have recently suggested for CuInS2 films. We thus conclude that this model, with slight variations, represents the general recombination level structure in all copper ternary chalcopyrites.

UR - https://www.scopus.com/pages/publications/0030408304

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AN - SCOPUS:0030408304

SN - 0272-9172

VL - 426

SP - 207

EP - 212

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

T2 - Proceedings of the 1996 MRS Spring Symposium

Y2 - 8 April 1996 through 11 April 1996

ER -

Determination of the recombination processes in copper ternary chalcopyrites by phototransport measurements

Abstract

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