Abstract
The dielectric photorefractive effect originates from light-induced metastable changes in the phase transition temperature of perovskites. Using an experimental method that enables the measurement of a photorefractive effect produced by the dielectric mechanism exclusively, it is shown that this effect exists in a KTN: Fe, Cr crystal and that the photorefractive sensitivity is S equals 6 multiplied by 10-**5 cm**3 /J. The potential performance of dielectric photorefractive materials in holography is briefly discussed. 13 refs.
Original language | English |
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Pages | 42-45 |
Number of pages | 4 |
DOIs | |
State | Published - 1986 |