Dielectric relaxation in porous glasses

A. Gutina, T. Antropova, E. Rysiakiewicz-Pasek, K. Virnik, Yu Feldman*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

83 Scopus citations

Abstract

Dielectric spectroscopy was applied to different types of porous silica glass materials, wherein the effect of water adsorption at the pored surface of the glasses on the dielectric response was examined over wide temperature (-100 to +300 °C) and frequency (20 Hz-1 MHz) ranges. The dielectric relaxation in the porous materials was analyzed in terms of non-Debye slow decay dynamics. The physical nature of different states of water in the porous glass materials is discussed. Analysis of the dielectric parameters enables us to characterize the fractal dimension and porosity of the porous glasses. In addition to dielectric spectroscopy, FT-IR spectroscopy and thermogravimetric analysis have also been applied.

Original languageEnglish
Pages (from-to)237-254
Number of pages18
JournalMicroporous and Mesoporous Materials
Volume58
Issue number3
DOIs
StatePublished - 18 Mar 2003

Keywords

  • Adsorbed water
  • Dielectric spectroscopy
  • Fractal dimension
  • Porosity
  • Porous glass

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