Differential second-order Raman spectroscopy

Y. Yacoby*, I. Wagner, J. Bodenheimer, W. Low

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Abstract

It is shown that measurement of the derivative of the second-order Raman spectrum with respect to wavelength of the scattered light gives information on the Van Hove critical points of the combined two-phonon energy function. The results of such a measurement on SrTiO3 at 10°K are presented and discussed.

Original languageEnglish
Pages (from-to)248-250
Number of pages3
JournalPhysical Review Letters
Volume27
Issue number5
DOIs
StatePublished - 1971

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