Abstract
The interfacial structures of self-assembled heterostructures through alternate deposition of conjugated and nonconjugated polymers were studied by x-ray reflectivity and nonspecular scattering. We found that the interfacial width including the effects of both interdiffusion and interfacial roughness (correlated) was mainly contributed by the latter one. The self-assembled deposition induced very small interdiffusion between layers. The lateral correlation length ξll grew as a function of deposition time (or film thickness) described by a power law ξllαtβ/H and was also observed from the off-specular scattering.
Original language | English |
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Article number | 161201 |
Pages (from-to) | 1612011-1612014 |
Number of pages | 4 |
Journal | Physical Review B - Condensed Matter and Materials Physics |
Volume | 66 |
Issue number | 16 |
DOIs | |
State | Published - 15 Oct 2002 |