We observe directly for the first time optical near field in silicon nanophotonics devices with nanoscale resolution using near field scanning thermal microscopy and demonstrated its advantage over the NSOM technique.
|Original language||American English|
|State||Published - 2014|
|Event||2014 Conference on Lasers and Electro-Optics, CLEO 2014 - San Jose, United States|
Duration: 8 Jun 2014 → 13 Jun 2014
|Conference||2014 Conference on Lasers and Electro-Optics, CLEO 2014|
|Period||8/06/14 → 13/06/14|
Bibliographical notePublisher Copyright:
© 2014 Optical Society of America.