Direct observation of electromagnetic near field in silicon nanophotonics devices using scanning thermal microscopy (SThM) technique

Meir Grajower, Liron Stern, Boris Desiatov, Ilya Goykhman, Uriel Levy

Research output: Contribution to conference › Paper › peer-review

2 Scopus citations

Fingerprint

Dive into the research topics of 'Direct observation of electromagnetic near field in silicon nanophotonics devices using scanning thermal microscopy (SThM) technique'. Together they form a unique fingerprint.

Keyphrases

Engineering

Physics