Direct observation of electromagnetic near field in silicon nanophotonics devices using Scanning Thermal Microscopy (SThM) technique

Meir Grajower, Liron Stern, Boris Desiatov, Ilya Goykhman, Uriel Levy

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Fingerprint

Dive into the research topics of 'Direct observation of electromagnetic near field in silicon nanophotonics devices using Scanning Thermal Microscopy (SThM) technique'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy