Abstract
Recent work has demonstrated the effectiveness of using patch based representations when learning from image data. Here we provide theoretical support for this observation, by showing that a simple semi-supervised algorithm that uses patch statistics can efficiently learn labels produced by a one-hidden-layer Convolutional Neural Network (CNN). Since CNNs are known to be computationally hard to learn in the worst case, our analysis holds under some distributional assumptions. We show that these assumptions are necessary and sufficient for our results to hold. We verify that the distributional assumptions hold on real-world data by experimenting on the CIFAR-10 dataset, and find that the analyzed algorithm outperforms a vanilla one-hidden-layer CNN. Finally, we demonstrate that by running the algorithm in a layer-by-layer fashion we can build a deep model which gives further improvements, hinting that this method provides insights about the behavior of deep CNNs.
Original language | English |
---|---|
Pages (from-to) | 2336-2356 |
Number of pages | 21 |
Journal | Proceedings of Machine Learning Research |
Volume | 162 |
State | Published - 2022 |
Event | 39th International Conference on Machine Learning, ICML 2022 - Baltimore, United States Duration: 17 Jul 2022 → 23 Jul 2022 https://proceedings.mlr.press/v162/ |
Bibliographical note
Funding Information:This project was partially funded by the European Research Council (ERC) under the European Unions Horizon 2020 research and innovation programme (grant ERC HOLI 819080). AB is supported by a Google PhD fellowship.
Publisher Copyright:
Copyright © 2022 by the author(s)