Electric-field-induced impact ionization of excitons in GaN and GaN/AlGaN quantum wells

D. K. Nelson*, M. A. Yacobson, V. D. Kagan, B. Gil, N. Grandjean, B. Beaumont, J. Massies, P. Gibart

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

Impact ionization of exciton states in epitaxial GaN films and GaN/AlGaN quantum-well structures was studied. The study was done using an optical method based on the observation of exciton photoluminescence quenching under application of an electric field. It was established that electron scattering on impurities dominates over that from acoustic phonons in electron relaxation in energy and momentum. The mean free path of the hot electrons was estimated. The hot-electron mean free path in GaN/AlGaN quantum wells was found to be an order of magnitude larger than that in epitaxial GaN films, which is due to the electron scattering probability being lower in the two-dimensional case.

Original languageEnglish
Pages (from-to)2321-2327
Number of pages7
JournalPhysics of the Solid State
Volume43
Issue number12
DOIs
StatePublished - Dec 2001
Externally publishedYes

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