TY - JOUR
T1 - Electron impact detachment of small negative clusters
AU - Zajfman, D.
AU - Heber, O.
AU - Diner, A.
AU - Witte, P.
AU - Strasser, D.
AU - Toker, Y.
AU - Rappaport, M. L.
AU - Ben-Itzhak, I.
AU - Guliamov, O.
AU - Kronik, L.
AU - Schwalm, D.
AU - Wolf, A.
PY - 2005
Y1 - 2005
N2 - Results for electron impact detachment of internally cold C n- and Aln- clusters are presented. The experiments were performed using an electrostatic ion beam trap fitted with an internal electron target. The measured electron impact detachment cross sections for the Cn- (n=1-9) clusters exhibit an even-odd oscillation, which is in agreement with the familiar even-odd variation in the binding energy, namely higher cross section for weaker binding. However, the cross sections increase on average with the cluster size, in spite of the average increase in the binding energy. We suggest, based on the data and on preliminary calculations, that the size dependent polarizability is the cause of this effect.
AB - Results for electron impact detachment of internally cold C n- and Aln- clusters are presented. The experiments were performed using an electrostatic ion beam trap fitted with an internal electron target. The measured electron impact detachment cross sections for the Cn- (n=1-9) clusters exhibit an even-odd oscillation, which is in agreement with the familiar even-odd variation in the binding energy, namely higher cross section for weaker binding. However, the cross sections increase on average with the cluster size, in spite of the average increase in the binding energy. We suggest, based on the data and on preliminary calculations, that the size dependent polarizability is the cause of this effect.
UR - http://www.scopus.com/inward/record.url?scp=21444440137&partnerID=8YFLogxK
M3 - ???researchoutput.researchoutputtypes.contributiontojournal.conferencearticle???
AN - SCOPUS:21444440137
SN - 0951-3248
VL - 183
SP - 173
EP - 181
JO - Institute of Physics Conference Series
JF - Institute of Physics Conference Series
T2 - Proceedings of the International Conference on Electron and Photon Impact Ionization and Related Topics 2004
Y2 - 1 July 2004 through 3 July 2004
ER -