Electron spin resonance microscopic surface imaging using a microwave scanning probe

F. Sakran*, A. Copty, M. Golosovsky, N. Bontemps, D. Davidov, A. Frenkel

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

18 Scopus citations

Abstract

Electron spin resonance microscopic surface imaging using a microwave scanning probe was discussed. The probe consisted of an open dielectric resonator with a thin-slit aperture. Spatially-resolved measurements on diphenyl-picryl-hydrazil samples on a substrate were demonstrated. Results showed that a sensitivity of 1011 spins could be achieved using a 4-μm-wide slit operating at 8.5 GHz and in a contact mode.

Original languageEnglish
Pages (from-to)1479-1481
Number of pages3
JournalApplied Physics Letters
Volume82
Issue number9
DOIs
StatePublished - 3 Mar 2003

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