Ellipses from triangles

M. Cicconet; K. Gunsalus; D. Geiger; M. Werman

doi:10.1109/ICIP.2014.7025736

Ellipses from triangles

M. Cicconet, K. Gunsalus, D. Geiger, M. Werman

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

7 Scopus citations

Abstract

We present an ellipse finding and fitting algorithm that uses points and tangents, rather than just points, as the basic unit of information. These units are analyzed in a hierarchy: points with tangents are paired into triangles in the first layer and pairs of triangles in the second layer vote for ellipse centers. The remaining parameters are estimated via robust linear algebra: eigen-decomposition and iteratively reweighed least squares. Our method outperforms the state-of-the-art approach in synthetic images and microscopic images of cells.

Original language	English
Title of host publication	2014 IEEE International Conference on Image Processing, ICIP 2014
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	3626-3630
Number of pages	5
ISBN (Electronic)	9781479957514
DOIs	https://doi.org/10.1109/ICIP.2014.7025736
State	Published - 28 Jan 2014
Externally published	Yes

Publication series

Name	2014 IEEE International Conference on Image Processing, ICIP 2014

Bibliographical note

Publisher Copyright:
© 2014 IEEE.

Keywords

cell counting
ellipse detection
ellipse fitting
image analysis
pattern recognition

Access to Document

10.1109/ICIP.2014.7025736

Cite this

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Ellipses from triangles. / Cicconet, M.; Gunsalus, K.; Geiger, D. et al.
2014 IEEE International Conference on Image Processing, ICIP 2014. Institute of Electrical and Electronics Engineers Inc., 2014. p. 3626-3630 7025736 (2014 IEEE International Conference on Image Processing, ICIP 2014).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Gunsalus, K.

AU - Geiger, D.

AU - Werman, M.

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N2 - We present an ellipse finding and fitting algorithm that uses points and tangents, rather than just points, as the basic unit of information. These units are analyzed in a hierarchy: points with tangents are paired into triangles in the first layer and pairs of triangles in the second layer vote for ellipse centers. The remaining parameters are estimated via robust linear algebra: eigen-decomposition and iteratively reweighed least squares. Our method outperforms the state-of-the-art approach in synthetic images and microscopic images of cells.

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KW - ellipse detection

KW - ellipse fitting

KW - image analysis

KW - pattern recognition

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ER -

Ellipses from triangles

Abstract

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Bibliographical note

Keywords

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