We present an ellipse finding and fitting algorithm that uses points and tangents, rather than just points, as the basic unit of information. These units are analyzed in a hierarchy: points with tangents are paired into triangles in the first layer and pairs of triangles in the second layer vote for ellipse centers. The remaining parameters are estimated via robust linear algebra: eigen-decomposition and iteratively reweighed least squares. Our method outperforms the state-of-the-art approach in synthetic images and microscopic images of cells.
|Original language||American English|
|Title of host publication||2014 IEEE International Conference on Image Processing, ICIP 2014|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|Number of pages||5|
|State||Published - 28 Jan 2014|
|Name||2014 IEEE International Conference on Image Processing, ICIP 2014|
Bibliographical notePublisher Copyright:
© 2014 IEEE.
- cell counting
- ellipse detection
- ellipse fitting
- image analysis
- pattern recognition