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EUV spectroscopy of highly charged xenon ions

  • C. Biedermann*
  • , R. Radtke
  • , G. Fußmann
  • , J. L. Schwob
  • , P. Mandelbaum
  • *Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

30 Scopus citations

Abstract

At the Berlin Electron Beam Ion Trap facility we investigated the radiation of highly charged xenon ions in the extreme ultraviolet wavelength range using a 2 m grazing incidence spectrometer. For Rb-like Xe17+ to Cu-like Xe25+ ions 37 individual lines have been registered in the range between 90 and 240 Å and identified by performing atomic structure calculations with the HULLAC code. The 4s-4p resonance lines of Cu-like and Zn-like Xe ions are found to be in good agreement with measurements at tokamaks and MCDF calculations. The experimental wavelengths for ions involving a larger number of electrons in the n = 4 shell deviate slightly from the predicted values. Several lines observed with the BerlinEBIT had been previously seen but not identified at the tokamak and can now be classified.

Keywords

  • EBIT
  • EUV-spectroscopy
  • Highly charged ions
  • Plasma diagnostics
  • Wavelength
  • Xenon

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