Experimentally quantifying the advantages of weak-values-based metrology

Gerardo I. Viza; Julian Martinez-Rincon; Gabriel B. Alves; Andrew N. Jordan; John C. Howell

Experimentally quantifying the advantages of weak-values-based metrology

Gerardo I. Viza, Julian Martinez-Rincon, Gabriel B. Alves, Andrew N. Jordan, John C. Howell

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We measure small optical beam deflections both using a Sagnac interferometer with a monitored dark port (the weak-values-based technique), or by focusing the entire beam to a split detector (the standard technique). By introducing controlled external modulations we quantify the mitigation of these sources in the weak values-based experiment versus the standard focusing experiment. In all cases, the weak-values technique out performs the standard technique by up to two orders of magnitude in precision for our parameters. We also show by post-selecting on 1% of the photons, we obtain 99% of the available Fisher information.

Original language	English
Title of host publication	2015 Conference on Lasers and Electro-Optics, CLEO 2015
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781557529688
State	Published - 10 Aug 2015
Externally published	Yes
Event	Conference on Lasers and Electro-Optics, CLEO 2015 - San Jose, United States Duration: 10 May 2015 → 15 May 2015

Publication series

Name	Conference on Lasers and Electro-Optics Europe - Technical Digest
Volume	2015-August

Conference

Conference	Conference on Lasers and Electro-Optics, CLEO 2015
Country/Territory	United States
City	San Jose
Period	10/05/15 → 15/05/15

Bibliographical note

Publisher Copyright:
© 2015 OSA.

Keywords

Laser beams
Modulation
Noise
Optical beams
Photonics
Sagnac interferometers
Standards

Cite this

Viza, G. I., Martinez-Rincon, J., Alves, G. B., Jordan, A. N., & Howell, J. C. (2015). Experimentally quantifying the advantages of weak-values-based metrology. In 2015 Conference on Lasers and Electro-Optics, CLEO 2015 Article 7183034 (Conference on Lasers and Electro-Optics Europe - Technical Digest; Vol. 2015-August). Institute of Electrical and Electronics Engineers Inc..

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title = "Experimentally quantifying the advantages of weak-values-based metrology",

abstract = "We measure small optical beam deflections both using a Sagnac interferometer with a monitored dark port (the weak-values-based technique), or by focusing the entire beam to a split detector (the standard technique). By introducing controlled external modulations we quantify the mitigation of these sources in the weak values-based experiment versus the standard focusing experiment. In all cases, the weak-values technique out performs the standard technique by up to two orders of magnitude in precision for our parameters. We also show by post-selecting on 1% of the photons, we obtain 99% of the available Fisher information.",

keywords = "Laser beams, Modulation, Noise, Optical beams, Photonics, Sagnac interferometers, Standards",

author = "Viza, {Gerardo I.} and Julian Martinez-Rincon and Alves, {Gabriel B.} and Jordan, {Andrew N.} and Howell, {John C.}",

note = "Publisher Copyright: {\textcopyright} 2015 OSA.; Conference on Lasers and Electro-Optics, CLEO 2015 ; Conference date: 10-05-2015 Through 15-05-2015",

year = "2015",

month = aug,

day = "10",

language = "אנגלית",

series = "Conference on Lasers and Electro-Optics Europe - Technical Digest",

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Viza, GI, Martinez-Rincon, J, Alves, GB, Jordan, AN & Howell, JC 2015, Experimentally quantifying the advantages of weak-values-based metrology. in 2015 Conference on Lasers and Electro-Optics, CLEO 2015., 7183034, Conference on Lasers and Electro-Optics Europe - Technical Digest, vol. 2015-August, Institute of Electrical and Electronics Engineers Inc., Conference on Lasers and Electro-Optics, CLEO 2015, San Jose, United States, 10/05/15.

Experimentally quantifying the advantages of weak-values-based metrology. / Viza, Gerardo I.; Martinez-Rincon, Julian; Alves, Gabriel B. et al.
2015 Conference on Lasers and Electro-Optics, CLEO 2015. Institute of Electrical and Electronics Engineers Inc., 2015. 7183034 (Conference on Lasers and Electro-Optics Europe - Technical Digest; Vol. 2015-August).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Martinez-Rincon, Julian

AU - Alves, Gabriel B.

AU - Jordan, Andrew N.

AU - Howell, John C.

PY - 2015/8/10

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KW - Modulation

KW - Noise

KW - Optical beams

KW - Photonics

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Experimentally quantifying the advantages of weak-values-based metrology

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