Exponent Trade-off for Hypothesis Testing Over Noisy Channels

Nir Weinberger, Yuval Kochman, Michele Wigger

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

8 Scopus citations

Abstract

The distributed hypothesis testing (DHT) problem is considered, in which the joint distribution of a pair of sequences present at separated terminals, is governed by one of two possible hypotheses. The decision needs to be made by one of the terminals (the "decoder"). The other terminal (the "encoder") uses a noisy channel in order to help the decoder with the decision. This problem can be seen as a generalization of the side-information variant of the DHT problem, where the rate-limited link is replaced by a noisy channel. A recent work by Salehkalaibar and Wigger has derived an achievable Stein exponent for this problem, by employing concepts from the DHT scheme of Shimokawa et al., and from unequal error protection coding for a single special message. In this work we extend the view to a trade-off between the two error exponents, additionally building on multiple codebooks and two special messages with unequal error protection. As a by product, we also present an achievable exponent trade-off for a rate-limited link, which generalizes Shimokawa et al..

Original languageAmerican English
Title of host publication2019 IEEE International Symposium on Information Theory, ISIT 2019 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1852-1856
Number of pages5
ISBN (Electronic)9781538692912
DOIs
StatePublished - Jul 2019
Event2019 IEEE International Symposium on Information Theory, ISIT 2019 - Paris, France
Duration: 7 Jul 201912 Jul 2019

Publication series

NameIEEE International Symposium on Information Theory - Proceedings
Volume2019-July
ISSN (Print)2157-8095

Conference

Conference2019 IEEE International Symposium on Information Theory, ISIT 2019
Country/TerritoryFrance
CityParis
Period7/07/1912/07/19

Bibliographical note

Publisher Copyright:
© 2019 IEEE.

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