Fast switching via frustrated total internal reflection in silicon photonics MEMS-Actuated waveguides

Eran Aharon; Dan M. Marom

doi:10.1109/OMN.2019.8925195

Fast switching via frustrated total internal reflection in silicon photonics MEMS-Actuated waveguides

Eran Aharon, Dan M. Marom

Department of Applied Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

We present a switching concept based on total internal reflection (TIR) and frustrated-TIR (F-TIR) using a MEMS movable waveguide fully compatible with silicon photonics technology. The switching element allows implementing large-scale photonic switches.

Original language	English
Title of host publication	OMN 2019 - 2019 International Conference on Optical MEMS and Nanophotonics, Proceedings
Publisher	IEEE Computer Society
Pages	216-217
Number of pages	2
ISBN (Electronic)	9781728145013
DOIs	https://doi.org/10.1109/OMN.2019.8925195
State	Published - Jul 2019
Event	2019 International Conference on Optical MEMS and Nanophotonics, OMN 2019 - Daejeon, Korea, Republic of Duration: 28 Jul 2019 → 1 Aug 2019

Publication series

Name	International Conference on Optical MEMS and Nanophotonics
Volume	2019-July
ISSN (Print)	2160-5033
ISSN (Electronic)	2160-5041

Conference

Conference	2019 International Conference on Optical MEMS and Nanophotonics, OMN 2019
Country/Territory	Korea, Republic of
City	Daejeon
Period	28/07/19 → 1/08/19

Bibliographical note

Publisher Copyright:
© 2019 IEEE.

Keywords

MEMS switch
Optical Switching
data center networking.
silicon photonics

Access to Document

10.1109/OMN.2019.8925195

Cite this

Aharon, E., & Marom, D. M. (2019). Fast switching via frustrated total internal reflection in silicon photonics MEMS-Actuated waveguides. In OMN 2019 - 2019 International Conference on Optical MEMS and Nanophotonics, Proceedings (pp. 216-217). Article 8925195 (International Conference on Optical MEMS and Nanophotonics; Vol. 2019-July). IEEE Computer Society. https://doi.org/10.1109/OMN.2019.8925195

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title = "Fast switching via frustrated total internal reflection in silicon photonics MEMS-Actuated waveguides",

abstract = "We present a switching concept based on total internal reflection (TIR) and frustrated-TIR (F-TIR) using a MEMS movable waveguide fully compatible with silicon photonics technology. The switching element allows implementing large-scale photonic switches.",

keywords = "MEMS switch, Optical Switching, data center networking., silicon photonics",

author = "Eran Aharon and Marom, {Dan M.}",

note = "Publisher Copyright: {\textcopyright} 2019 IEEE.; 2019 International Conference on Optical MEMS and Nanophotonics, OMN 2019 ; Conference date: 28-07-2019 Through 01-08-2019",

year = "2019",

month = jul,

doi = "10.1109/OMN.2019.8925195",

language = "אנגלית",

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Aharon, E & Marom, DM 2019, Fast switching via frustrated total internal reflection in silicon photonics MEMS-Actuated waveguides. in OMN 2019 - 2019 International Conference on Optical MEMS and Nanophotonics, Proceedings., 8925195, International Conference on Optical MEMS and Nanophotonics, vol. 2019-July, IEEE Computer Society, pp. 216-217, 2019 International Conference on Optical MEMS and Nanophotonics, OMN 2019, Daejeon, Korea, Republic of, 28/07/19. https://doi.org/10.1109/OMN.2019.8925195

Fast switching via frustrated total internal reflection in silicon photonics MEMS-Actuated waveguides. / Aharon, Eran; Marom, Dan M.
OMN 2019 - 2019 International Conference on Optical MEMS and Nanophotonics, Proceedings. IEEE Computer Society, 2019. p. 216-217 8925195 (International Conference on Optical MEMS and Nanophotonics; Vol. 2019-July).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Fast switching via frustrated total internal reflection in silicon photonics MEMS-Actuated waveguides

Abstract

Publication series

Conference

Bibliographical note

Keywords

Access to Document

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